Overview

The instrument is an FEI Helios NanoLab 600i DualBeam SEM/FIB, equipped with a focused Ga+ ion beam (known as “Tomahawk”) and a high-resolution field emission scanning electron (“Elstar”) column. This setup is enhanced by improvements in patterning, scripting, and various accessories. Together, these elements enable standard laboratory applications such as milling, imaging, analysis, and sample preparation at the nanoscale.

Key Features

1. Material Science: Researchers use the DualBeam to study the microstructure of materials, analyze phase distributions, and investigate the properties at the micro and nano scales. It’s especially useful for understanding metals, ceramics, and composites.
2. Semiconductor Manufacturing: The instrument is crucial for defect analysis, circuit edit, and failure analysis within semiconductor manufacturing. It allows for precise material removal and deposition which is essential for device modification and troubleshooting.
3. Biology and Life Sciences: In life sciences, the DualBeam can be used for ultra-structural studies of biological samples. It helps in preparing and analyzing sections of tissues or cells at nanometer resolutions.
4. Geology and Mineralogy: Geoscientists use the DualBeam to examine the fine structure of minerals and rocks. This can be particularly useful for understanding the crystalline structures and chemical compositions of geological samples.
5. Nanotechnology: The instrument is key in fabricating and manipulating nanostructures. It can be used for prototyping micro and nano devices, such as sensors, and for developing new materials with novel properties.
6. Forensics: In forensic science, the DualBeam helps in the detailed analysis of samples such as fibers, fragments, or residues, providing crucial information for investigations.
7. Cultural Heritage: Conservators and researchers use the DualBeam to study the materials and techniques used in historical artifacts, helping in preservation and restoration efforts.