Instruments
Overview
The Thermo Fisher Spectra 300 is a state-of-the-art monochromated, double-corrected scanning transmission electron microscope (STEM) designed for advanced research applications requiring high resolution and precise analytical capabilities. This instrument represents a significant leap in electron microscopy technology, offering unparalleled detail and accuracy in imaging and analysis.

Key Features:
- Monochromated Electron Source: The monochromated electron beam enhances image resolution by reducing chromatic aberration, allowing for more detailed and clearer images at atomic or near-atomic scales. This feature is particularly beneficial for materials science, nanotechnology, and semiconductor research, where understanding materials at the atomic level is crucial.
- Double Correction: Both spherical and chromatic aberrations are corrected in the Spectra 300, enabling it to achieve high-resolution imaging and analysis. This double correction maximizes the microscope’s performance by improving image contrast and sharpness, making it ideal for examining structural and compositional details in a wide range of specimens.
- Advanced Detectors: Equipped with a suite of advanced detectors, the Spectra 300 can perform various analytical techniques such as energy-dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and high-angle annular dark field imaging (HAADF). These capabilities allow for precise elemental and chemical characterization at the nanoscale.
- User-Friendly Interface: Despite its advanced capabilities, the Spectra 300 is designed with a user-friendly interface that simplifies complex procedures and enhances usability, making it accessible to both experienced researchers and newcomers to electron microscopy.
- Versatile Applications: The Spectra 300 is adept at handling a wide variety of sample types, from biological specimens to industrial materials, under different environmental conditions. This versatility makes it a valuable tool in fields ranging from life sciences and medicine to electronics and materials engineering.
Specifications
- Accelerating Voltages at 30, 60, 80, and 300 kV
- High Brightness Schottky field emission gun ( X-FEG)
- Monochromator
- Cs CETCOR/S-CORR double correctors
- Advanced STEM imaging, 4k×4k STEM data acquisition, EMPAD, 4D STEM
- SuperX energy dispersive spectroscopy (EDS ) detectors
- Ceta-S camera with speed enhancement capabilities
- Gatan K3 camera for low dose imaging
- Electron energy loss spectroscopy (EELS) with dual EELS GIF continuum spectrometer
- TEM, STEM, and EDS tomography with acquisition, reconstruction (Inspect3D) and analysis (Avizo) softwares
Instrument Resolution:
- Information Limit (TEM mode): 0.7 Å
- Probe resolution (STEM mode): 0.5 Å
- Energy resolution at 300 kV (with monochromator): 110 meV
- Energy resolution at 60 kV (with monochromator): 20 meV