Overview

The Bruker Dimension Icon is recognized as a leading high-end atomic force microscope, extensively used in both academic research and industrial applications. This tip-scanning system can accommodate large samples and is designed with acoustic and vibration isolation for enhanced stability and precise measurements. Its user-friendly software features partial parameter automation through ScanAsyst™, facilitating a quick learning curve for novice users. The system includes an 8-inch wafer chuck, providing sufficient space for various sample shapes and sizes. Additionally, the Dimension Icon offers several optional packages for advanced applications, including mechanical property mapping (modulus, adhesion, etc.; PeakForce QNM™), conductivity mapping (PeakForce TUNA™), and Kelvin Probe measurements (work function, surface potential; PeakForce KPFM™).

Key Features

1. Advanced Imaging Capabilities: The Dimension Icon utilizes Bruker’s proprietary PeakForce Tapping® technology to deliver exceptional imaging quality and resolution. This technology allows users to obtain high-resolution images with minimal tip and sample damage, making it suitable for delicate samples.
2. High Stability and Low Noise: The Icon’s design emphasizes stability and low noise, which are crucial for achieving high-quality data, especially in long-duration measurements. Its “closed-loop” scanning eliminates image artifacts and provides true atomic resolution.
3. Integrated Quantitative Nanomechanical Mapping: With Bruker’s Quantitative Nanomechanical Mapping (QNM), the Dimension Icon can measure material properties such as modulus, adhesion, and deformation at the nanoscale, providing critical insights into material behavior and characteristics.