Instruments
Overview
The ZEISS Xradia 520/630 Versa are highly advanced X-ray microscopes known for its versatility and exceptional imaging capabilities, making it an indispensable tool in scientific research and industrial inspection. This microscope from ZEISS combines the benefits of non-destructive imaging with high resolution, bridging the gap between advanced microscopy and traditional material analysis methods.

Key Features
- Non-Destructive 3D Imaging: The Xradia 520 Versa enables 3D imaging of internal structures without the need for sectioning or sample preparation that could potentially alter or damage the sample. This feature is crucial for understanding the true nature of materials, components, and biological specimens.
- High Resolution: With the capability to achieve resolutions down to the sub-micron level, the Xradia 520 Versa provides detailed and precise images. This high resolution is instrumental for detailed analysis in applications such as microelectronics, geology, and life sciences.
- VersaXRM Technology: This technology ensures that the microscope delivers high contrast and high resolution, regardless of sample size. The VersaXRM system allows for flexibility in working distances and energies, adapting to different imaging requirements.
- Advanced Reconstruction Software: The Xradia 520 Versa comes with sophisticated software that assists in reconstructing complex 3D images from the captured 2D data. This software not only enhances image quality but also simplifies the analysis process, allowing for more accurate interpretations and measurements.
- In Situ Capabilities: One of the standout features of the Xradia 520 Versa is its ability to perform in situ imaging under varying environmental conditions and during mechanical testing. This is particularly useful for studying material behaviors under stress, temperature changes, or other physical alterations.
- Wide Range of Applications: The microscope is used across a broad spectrum of fields, including materials science, biological research, and industrial manufacturing. Whether it’s for analyzing the porosity of materials, investigating integrated circuits, or observing biological tissues, the Xradia 520 Versa provides critical insights that drive innovation and understanding.
Specifications
- Spatial Resolution: 0.7µm
- Resolution at a Distance (RaaD)* at 50 mm working distance: 1.0 µm
- RaaD working distance defined as clearance around axis of rotation
- X-ray Source: Sealed transmission
- Tube Voltage Range: 30 – 160 kV
- Maximum Power Output: 10 W
- Radiation safety: < 1 μS/hr (equivalent to 0.10 mRem/hr)
- Standard Objective: 0.4X, 4X, 20X, 40X Magnification
- Sample Stage
- Load capacity: 25 kg
- Stage translation (x, y, z): 45, 100, 50 mm
- Stage rotation: 360˚
- Sample size Limit: 300 mm
- Modules
- Absorption contrast
- Phase contrast
- LabDCT Diffraction Contrast Tomography
- Scout and scan control system
- High-Aspect Ratio Tomography
- Automated Filter Changer
- DSCoVer Dual Scan Contrast Visualizer