Overview

Ion milling is used in the physical sciences to enhance the sample’s surface characteristics. Inert gas, typically argon, is ionized and then accelerated toward the sample surface. By means of momentum transfer, the impinging ions sputter material from the sample at a controlled rate.

For many of today’s advanced materials, analysis by scanning electron microscopy is an ideal technique for rapidly studying material structure and properties. The SEM Mill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analysis.

Key Features

1. Two independently adjustable TrueFocus ion sources
2. High energy operation for rapid milling; low energy operation for sample polishing
3. Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
4. Faraday cups for the direct measurement of beam current from each ion source
5. Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters
6. Create pristine cross-section samples with the Cross-section station (optional)
7. Independent ion source gas control
8. Adjustable milling angle range of 0 to +10°
9. In situ viewing and image capture during milling
10. Sample rocking or rotation with ion beam sequencing
11. Automatic termination by time or temperature
12. Liquid nitrogen-cooled sample stage
13. Vacuum or inert gas transfer capsule