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Instruments
At CaliResearch, we bring precision, reliability, and innovation to every test, analysis, and experiment. Our state-of-the-art facilities are equipped with the latest technologies and staffed by experts committed to delivering accurate results and insights.
SEM-FIB
Focused ion beam cutting and imaging, re-construct 3D image of the bulk, TEM sample preparation, EDS mapping, EBSD mapping
S/TEM
Up to 50 pm resolution STEM, EDS mapping, EELS mapping: detailed imaging and analysis of the crystal structure, chemical composition
AFM
Regular topography mapping, plus mechanical property mapping, conductivity mapping, and Kelvin Probe measurements
XPS
From elemental composition to chemical state identification. Surface and depth profile chemical analysis
XRD
Comprehensive phase identification and crystalline structure analysis with 2D detector and operando capability
X-ray CT
XCT provides non-destructive examination of internal structures, density variations, and component integrity
ToF-SIMS
ToF-SIMS is a technique sensitive to surface composition, capable of detecting surface elements at concentrations ranging from 1 ppm to 10 ppb
And more…