Overview

The Empyrean X-ray Diffractometer from PANalytical B.V. serves as a versatile research diffractometer capable of handling various configurations, including powder, medium-resolution, and high-resolution. It is particularly effective for in situ/operando X-ray studies that monitor material changes in controlled environments and during actual operations. This diffractometer supports all essential diffraction geometries such as reflection, transmission, capillary, microdiffraction, and Debye-Scherrer. It accommodates a range of X-ray tubes, from softer (Cu source, 8.04 keV) to medium (Mo source, 17.44 keV) and hard (Ag source, 22.10 keV) radiations, making it adaptable to different research needs. Capable of analyzing all types of samples—ranging from powders to thin films and from nanomaterials to solid objects—this single instrument provides comprehensive capabilities. The PreFIX concept for optical components and sample stages allows users to switch operation modes quickly, without the need for system realignment. Its versatility enables specialized in situ/operando experiments. Additionally, the instrument’s software fully controls a range of non-ambient environments, enhancing its utility and precision in advanced material studies.

Key Features

1. Powder diffraction using flat and capillary samples in either reflection or transmission geometries employing 0D, 1D and 2D detector modes.
2. Medium- and high-resolution x-ray diffraction of thin films including symmetrical, asymmetrical and grazing incidence diffraction, x-ray reflectivity, texture, stress, rocking curves, fast reciprocal lattice maps.
3. Non-ambient x-ray diffraction in transmission and reflection geometries in different atmospheres and vacuum up to 1200 C.
4. X-ray diffraction studies of solid state and solid state-gas reactions in different gas environments up to 900 C and 10 bar.
5. Medium- and high-resolution x-ray diffraction studies of thin films and layered materials in the temperature range of 173 – 770 K (-100 – 500 C).